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Applied Physics, Inc. (ÅP™) can be reached at 720-635-3931 and has been in business since 1992 providing aerosol impactors, such as the
MOUDI Cascade Impactor and Nano-MOUDI impactor to Science Universities and Government laboratories. Cleanroom foggers and Di Water foggers are
provided to visualize airflow and air turbulence in Semiconductor fabs and pharmaceutical labs. The Model 2300 NPT-2 PSL and Particle Deposition System
is used by Semiconductor Device manufacturers to calibrate the size response curves of KLA-Tencor SP1, SP2 and SPX Wafer Inspection Systems; as well as Topcon, Hitachi
and ADE Scanning Surface Inspection Systems. 2300 NPT-2E Edge Deposition tools deposit Si, SiO2, Al2O3, TiO2, Si3N4, Ti, W, Cu and Tantalum particles on the silicon
wafer edge and bevel to calibrate Rudolph, KLA-Tencor and Raytex edge inspection tools. Metrology managers can reduce wafer particle contamination by investigating
particle migration from the wafer edge to the device chip on the silicon wafer. 2300 NPT-2W WET Particle Deposition tools bond process particles onto the wafer surface
with a variety of wet liquids.
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UltraPure Fogger |
Clean Room Fogger |
Microbial Air Samplers |
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Clean Room Foggers and UltraPure Foggers support USP797 guidelines for Insitu airflow pattern and turbulence analysis. Microbial Air Samplers monitor unwanted fungal and bacterial growth in ISO 5 Filling Lines, Barrier Isolators and ISO 7 -9 areas.
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UltraPure Clean room Foggers and DI Water Foggers to visualize airflow and turbulence in Class 1 to class 100,000 clean rooms.
We offer a variety of clean room foggers including Model 2001 UltraPure Clean room Fogger and
Cleanroom DI Water Fogger. Here is an overview of Clean room Fogger Technology.
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Cascade Impactors with sharp cut points for high resolution particle sampling from 10nm to 18um.
We offer all MOUDI Cascade Impactor Models, the
Nano-MOUDI Cascade Impactor and
Non-Rotating Moudi Cascade Impactor
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EMTEK Microbial Air Samplers provide superb Bacterial and Fungal sampling to monitor ISO 5, ISO 7 and ISO 9 Pharmaceutical production for microbiological contamination with much higher capture efficiency.
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Monitor and count unwanted particle contamination with Water Condensation Particle Counter in aerosol, high purity gas lines, less than 10nm, flow rate of 3 lpm.
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We offer particle deposition systems. Produce NIST traceable, PSL Wafer Standards, 20nm to 4um on 200mm &
300mm wafers; calibrate KLA-Tencor, Topcon, ADE Hitachi wafer inspection systems.
Deposit Si, SiO2, Al2O3, TiO2, Si3N4, Ti, W, Cu, Ta Particle Wafers to verify WET Bench cleaning performance, make yield improvements.
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Calibration Wafers
PSL quick check wafers and PSL Wafer Standards, calibration wafers. Duke PSL spheres, 40nm - 4um, pre-mixed or 1% concentration.
Si, SiO2, Al2O3, TiO2, Si3N4, Ti, W, Cu, Ta particles in DiH2O solution.
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