M2001 Fogger, Clean Room Fogger, Silica, SiO2 Particles, PSL spheres, Particle Wafer Standard, Smoke Generator, MOUDI Impactor, Cascade Impactor, Nano-MOUDI


CALL US: 720-635-3931

Applied Physics, Inc. (ÅP™), TEL: 1-720-635-3931, provides PSL and particle contamination wafer standards, Clean Room Foggers, LN2 Foggers, M2001 foggers, along with aerosol instruments, such as the MOUDI Impactor, Cascade Impactor and the Nano-MOUDI to Science Universities and aerosol research laboratories. The Clean Room Fogger and M2001 UltraPure LN2 Fogger are sometimes referred to as Smoke Generators or Cleanroom Foggers. Each smoke generator will visualize airflow patterns and turbulence in Semiconductor and Pharmaceutical facilities. The CleanRoom Fogger has the lower cost, while the M2001 Fogger has the highest fog volume in the industry. Particle Wafer Standards and PSL Wafer Standards are produced on 300mm wafers, 200mm wafers, 150mm wafers, blank photo masks and customer FILM wafers. SiO2 particles are used to produce Particle Wafer Standards; while Silica is used in CMP slurries, solar cell manufacturing, high pressure liquid chromatography, nano-composites, pharmaceutical drug delivery and mesoporous silica nanoparticles (MSN).

PSL Wafer Calibration Standards: PSL Wafer Standards, NIST traceable, PSL calibration wafer standards on 300mm, 200mm, 150mm, 125mm, 100mm silicon wafers and FILM WAFERS
Particle Wafer Calibration Standards: SiO2 Particle Wafer Standards, Particle Wafer Standards using Silica, SiO2, Silicon Dioxide, Aluminum Oxide, Titanium Oxide, Silicon Nitride, Titanium, Tungsten, Copper or Tantalum particles on 300mm, 200mm, 150mm, 125mm, 100mm wafers and FILM WAFERS
PSL Spheres from 20nm to 160 microns, monodisperse PSL spheres
Silica available in bulk, dry powder from 200nm to 2 microns with volumes of 1 Kilo to 200 Kilos for CMP slurries, mesoporous silica nano-particles (MSN), Thin Film, Solar Cell Manufacturing and Nano-Composites.
SiO2 Particles in 15ml bottles of Di Water Solution and 10% concentration from 20nm to 2 microns, monodisperse SiO2 particles
M2001 LN2 Fogger: UltraPure Fogger producing 15CFM of ultrapure fog for 40 minutes using LN2 and DI Water to visualize airflow, patterns and turbulence
Clean Room Fogger: Smoke Generator and airflow visualizer producing 8CFM of Fog for 60 minutes using DI Water or WFI to monitor cleanroom airflow patterns
Room Sanitizer: Compound Pharmacy, ISO 5-9 Suites and Medical Room Decontamination

Our 2300XP1 Particle Deposition System deposites PSL Spheres, silica and SiO2 particles from 40 nm to 5 um+ on Prime Silicon wafers, blank photo masks, glass substrates or your FILM WAFERS for size calibration of KLA-Tencor Surfscan SP2, KLA-Tencor Surfscan SP1, Surfscan SP3, Surfscan SP5, Surfscan 6420, Surfscan 6220, Surfscan 6200, ADE, Hitachi and Topcon SSIS tools and wafer inspection systems. PSL Spheres and SiO2 particles can be deposited on a 450mm wafer, 300mm wafer, 200mm wafer, 150mm wafer, 125mm wafer or 100mm wafer. PSL Spheres can also be used for size calibration of your laser particle counter.

  M2001 UltraPure Fogger Clean Room Fogger Microbial Air Sampler  
M2001 Fogger Clean Room Fogger Microbial Air Sampler
Clean Room Fogger, M2001 Fogger and the UltraPure LN2 Fogger are used to support USP 797 guidelines for Insitu airflow analysis of airflow patterns and turbulence and Semiconductor Clean Room Guidelines. A Microbial Air Sampler will monitor unwanted fungal and bacterial growth in ISO 5, ISO 7 and ISO 9 Filling Lines, as well as Barrier Isolators.

Clean Room Fogger

Clean Room Fogger We offer a variety of clean room foggers including M2001 LN2 Fogger and Clean Room Fogger. M2001 Fogger, UltraPure LN2 fogger, Smoke Generators and DI Water Foggers used to visualize airflow patterns, turbulence in Class 1 to 100,000 clean rooms.

Cleanroom Fogger Information

Particle Calibration Wafer Standards and PSL Wafer Standards

Particle Wafer Standards We produce PSL Wafer Standards, SiO2 Particle Wafer Standards and Particle Calibration Wafers on Prime Silicon Wafers and your FILM Wafers. NIST traceable, PSL Wafer Standards and Particle Size Calibration Wafers are provided from 20nm to 5um on 100mm, 125mm, 150mm, 200mm & 300mm wafers to calibrate KLA-Tencor SP1, KLA-Tencor SP2, KLA-Tencor SP3, Topcon, ADE and Hitachi wafer inspection systems. Deposit Silicon, Silicon Dioxide, Aluminum Oxide, Titanium Oxide, Silicon Nitride, Titanium, Tungsten, Copper, Tantalum particle as Particle Wafer Standards.

Calibration Wafer Standards Information

PSL Spheres PSL Spheres in 1% concentration and 15ml DI Water; or Surf-Cal, pre-mixed PSL Spheres.
Silica nanoparticles in Bulk for CMP slurries, solar cell manufacturing, high pressure liquid chromatography, nano-composites, pharmaceutical drug delivery and mesoporous silica nanoparticles (MSN). SiO2 Particles in DI Water Solution for size calibration from 20nm to 2 microns.

Silica Information

Condensation Particle Counter

Condensation Particle Counter Monitor and count unwanted aerosol particle contamination with water based, Condensation Particle Counter in aerosol, high purity gas lines at 5nm and above with flowrates of 1 LPM and 3 LPM.

Condensation Particle Counter Information


Cascade Impactor and MOUDI Impactor or Nano-MOUDI

Cascade Impactor Cascade Impactor provides sharp cut points for high resolution particle sampling from 10nm to 18um. We offer the MOUDI and Nano-MOUDI, cascade impactors, the Nano-MOUDI Impactor and Non-Rotating, Cascade Impactors

Cascade Impactor Information

DryFog Room Sanitizer

Room SanitizerDry Fog Room Sanitizers provide superb decontamination of bacterial and fungal contamination in a compound pharmacy, as well as ISO 5, ISO 7 and ISO 9 Pharmaceutical suites, killing microbiological contamination. Sanitizing Fogger Sanitize a Compound Pharmacy.

Room Sanitizer, Room Decontamination Information