Applied Physics, Inc. (ÅP™) can be reached at 303-678-9102 and has been in business since 1992 providing aerosol impactors, such as the MOUDI Cascade Impactor and Nano-MOUDI impactor to Science Universities and Government laboratories. Cleanroom foggers and Di Water foggers are provided to visualize airflow and air turbulence in Semiconductor fabs and pharmaceutical labs. The Model 2300 NPT-2 PSL and Particle Deposition System is used by Semiconductor Device manufacturers to calibrate the size response curves of KLA-Tencor SP1, SP2 and SPX Wafer Inspection Systems; as well as Topcon, Hitachi and ADE Scanning Surface Inspection Systems. 2300 NPT-2E Edge Deposition tools deposit Si, SiO2, Al2O3, TiO2, Si3N4, Ti, W, Cu and Tantalum particles on the silicon wafer edge and bevel to calibrate Rudolph, KLA-Tencor and Raytex edge inspection tools. Metrology managers can reduce wafer particle contamination by investigating particle migration from the wafer edge to the device chip on the silicon wafer. 2300 NPT-2W WET Particle Deposition tools bond process particles onto the wafer surface with a variety of wet liquids.
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| Video Highlights: |
UltraPure Cleanroom Fogger |
Di Water Fogger |
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| Supports Semiconductor Clean Room Guidelines for airflow, pattern, turbulence visualization
Supports USP 797 Pharmaceutical In-Situ Airflow Analysis |
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Cascade Impactors with sharp cut points for high resolution particle sampling from 10nm to 18um.
We offer all MOUDI Cascade Impactor Models, the
Nano-MOUDI Cascade Impactor and
Non-Rotating Moudi Cascade Impactor
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 UltraPure Clean room Foggers and DI Water Foggers to visualize airflow and turbulence in Class 1 to class 100,000 clean rooms.
We offer the a variety of clean room foggers including Model 2001 UltraPure Clean room Fogger and
Model 2010, UltraPure Cleanroom Fogger. Here is an overview of Clean room Fogger Technology.
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Aerosol particle counters provide counting and sizing from 10nm to 10um. Supports smoke stack, SMOG, diesel and atmospheric contamination measurements.
We also offer condensation particle counters.
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Calibration Wafers
PSL quick check wafers and PSL Wafer Standards, calibration wafers. Duke PSL spheres, 40nm - 4um, pre-mixed or 1% concentration.
Si, SiO2, Al2O3, TiO2, Si3N4, Ti, W, Cu, Ta particles in DiH2O solution.
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We offer particle deposition systems. Produce NIST traceable, PSL Wafer Standards, 20nm to 4um on 200mm &
300mm wafers; calibrate KLA-Tencor, Topcon, ADE Hitachi wafer inspection systems.
Deposit Si, SiO2, Al2O3, TiO2, Si3N4, Ti, W, Cu, Ta Particle Wafers to verify WET Bench cleaning performance, make yield improvements.
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 The Model 170 Next Generation Pharmaceutical Impactor (NGI) is a high-performance, precision, particle-classifying cascade impactor for testing metered-dose, dry-powder, and similar inhaler devices.
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